This docu­ment exami­nes the ope­ra­ti­on of the LSPro­be E‑field pro­bes in the pre­sence of pul­sed elec­tric fields much lar­ger than the spe­ci­fied dama­ge level. The pre­sen­ted results pro­ve the field probe’s har­di­ness and show how it may be used to cha­rac­te­ri­ze
such fields.